142 posts
EDGE / / 9 minutes read

5-1-7 The Spatial Reversal: The Performance Revolution of RDL and Flip Chip (Flip Chip Packaging)

Flip Chip's spatial reversal breaks wire bonding bottlenecks. RDL routes contacts from edge to interior; copper pillars connect directly to substrate, reducing latency, increasing bandwidth, optimizing cooling. Despite thermal expansion warping (needs underfill), it's crucial for AI chip compute ...
EDGE / / 10 minutes read

5-1-6 The Immortal Veteran and Its Limits: Lead Frame, Die Bond, and Wire Bond

Lead frame packaging status. Advanced packaging a focus, but 80% of chips rely on cost-effective lead frames. Taiwan's 'Three Musketeers' (Shuen De, Chang Wah Electromaterials, Jielin) solidify market via metallurgy, M&A, power modules. Die/wire bond challenges. Efficiency/physical limits positio...
EDGE / / 7 minutes read

5-1-5 The Limits of Physical Dicing: From Mechanical Blades to Laser Stealth Dicing (Stealth Dicing)

Semiconductor dicing examined: traditional blades cause Low-k material chipping and thinned wafer yield issues. Laser stealth dicing achieves precise separation via internal modification/tape expansion, solving these. Consumables market analyzed; Taiwanese firm Titan Speech excels in advanced pac...
EDGE / / 9 minutes read

5-1-4 Microsurgery for Overcoming Distance: Bumping (Long Bump)'s Material Evolution

Article analyzes advanced packaging's 'long bump' process, key for efficient AI chip transmission. Materials evolved from solder balls to stable copper pillars due to miniaturization/heat. This sparked a TSMC-ASE power struggle, driving capacity gains for wet process suppliers (Grand Plastic, Sci...
EDGE / / 18 minutes read

5-1-3 MPI Corporation (6223) and Chunghwa Precision Test Technology (6510)'s Probe Cards —— Safeguarding the Lifeline of KGD Yield

AI's Chiplet drive multiplies multi-chip yield issues, KGD critical. Probe cards, for precise microscopic wafer electrical testing, create a high barrier via precision/materials. Their consumable nature (wear, updates) ensures a stable economic model; MPI & CHPT guard advanced packaging yield.
EDGE / / 10 minutes read

5-1-2 The Harsh Reality of Testing: This Isn't QA, But a 'Capital Allocation Tool'

Semiconductor testing, in advanced processes, is a 'capital allocation tool'. It prevents sunk costs, intercepting defective bare die pre-costly packaging, saving scarce capacity. Maximizes wafer gross margins via precise chip quality pricing & grading tech. This is a strategic risk control for g...